Energy News  
Optical Lithography Refinement Essential For Advancing NGL Technologies

S�ss MJB 3 maskaligner for optical lithography

Palo Alto CA (SPX) Aug 17, 2004
Optical lithography may currently offer the advantage of high wafer throughputs, but to sustain in the long term and compete with the next generation lithography (NGL) technologies, it must deliver finer resolution and achieve the desired quality, reliability, and cost targets.

"Constant improvements in optical lithography are likely to play a crucial role in assisting the semiconductor industry to achieve shrinking device sizes and increased chip performance," says Technical Insights Research Analyst Sivakumar Muthuramalingam.

Extending optical lithography toward the 193-nm wavelength is expected to provide feature sizes of 65-nm and beyond for the high-volume production of advanced memory and semiconductor devices. Extensions beyond 193-nm wavelength require better enhancement techniques and precision sources than are currently available.

Optical lithography must also tackle the issue of low contrast aerial image to reduce mask error. Sophisticated engineering techniques such as advanced lithography masks and off-axis illumination are likely to be critical in minimizing mask error.

However, with optical lithography methods approaching their limits and semiconductor manufacturers looking at the sub-50 nm node to create smaller, lighter, faster, and more powerful devices, NGL technologies are anticipated to prove to be the future of the semiconductor industry.

"A successful NGL candidate must demonstrate extendibility below 70-nm, reduced cost of ownership, high wafer throughput, and defect-free mask technology," emphasizes Muthuramalingam.

Despite technical and economical hurdles, extreme ultra violet lithography (EUVL) and electron projection lithography (EPL) with their ability to pattern features as small as 32-nm are the prime contenders to replace optical lithography.

Researchers believe EUVL is the right step toward a 32-nm node, although certain concerns such as masks, costs, and timing need to be addressed before commercialization.

EUVL improves the quality of the pattern projected onto the silicon wafer, thereby increasing the chip performance. This technology is likely to be extremely useful for creating universal language translators and high-volume applications such as processors and dynamic random access memories (DRAMs).

EPL is also an attractive candidate vying to succeed optical lithography. In EPL standard stencil masks reduce costs while the mature electron beam resists eliminate the timing risks associated with EUVL.

However, the relatively low throughput works against EPL as a possible successor to optical lithography. Scaling the throughput from the present 10-15 wafers to 25-30 wafers per hour is anticipated to allow EPL to meet increasing demands from the semiconductor industry.

Nano-imprint lithography (NIL) is also a promising and cost-effective NGL solution that avoids the use of expensive optics and sophisticated enhancement techniques such as phase-shift masks.

NGL prototype tools have to first be developed and demonstrated successfully in the laboratories. Their commercial success will depend on the amount of applied and product-oriented research conducted in the near future.

"Researchers must develop adequate techniques to manufacture and assemble NGL tools into prescribed geometries and also adopt comprehensive quality assurance steps that ensure adherence to requirements," concludes Muthuramalingam.

Semiconductor Microlithography, part of the Semiconductor Vertical Subscription Service, examines challenges facing the optical lithography technology and the potential of next-generation lithography technologies.

Apart from key technology drivers, evaluation of the challenges facing NGL technologies is also provided. Executive summaries and interviews are available to the press.

Community
Email This Article
Comment On This Article

Related Links
Technical Insights
SpaceDaily
Search SpaceDaily
Subscribe To SpaceDaily Express
Space Technology News - Applications and Research



Memory Foam Mattress Review
Newsletters :: SpaceDaily :: SpaceWar :: TerraDaily :: Energy Daily
XML Feeds :: Space News :: Earth News :: War News :: Solar Energy News


Industry Team Achieve New Communications Technology With AESA Radars
Baltimore MD (SPX) Jan 12, 2006
A team comprised of three leading US aerospace and defense contractors has demonstrated an innovative technological use of active electronically scanned array (AESA) radars for high-bandwidth communications.







  • Sun Solaris Compute Grid Powers NextGen Nuclear Reactor Design From The DoE
  • Nuclear Energy Institute Praises Exelon-DOJ Used Fuel Settlement
  • Scientists Able To Harness Plankton Power
  • Asymmetric Feature Shows Puzzling Face For Superconductivity

  • Yucca Mountain Site Must Make Use Of Geological Safety Net
  • New Jersey Physicist Uncovers New Information About Plutonium
  • Complex Plant Design Goes Virtual To Save Time And Money
  • Volcanic Hazard At Yucca Mountain Greater Than Previously Thought





  • NASA Uses Remotely Piloted Airplane To Monitor Grapes



  • NASA To Award Contract For Aerospace Testing
  • Sonic Boom Modification May Lead To New Era
  • Hewitt Pledges Support For Aerospace Industry
  • National Consortium Picks Aviation Technology Test Site

  • NASA plans to send new robot to Jupiter
  • Los Alamos Hopes To Lead New Era Of Nuclear Space Tranportion With Jovian Mission
  • Boeing Selects Leader for Nuclear Space Systems Program
  • Boeing-Led Team to Study Nuclear-Powered Space Systems

  • The content herein, unless otherwise known to be public domain, are Copyright 1995-2006 - SpaceDaily.AFP and UPI Wire Stories are copyright Agence France-Presse and United Press International. ESA PortalReports are copyright European Space Agency. All NASA sourced material is public domain. Additionalcopyrights may apply in whole or part to other bona fide parties. Advertising does not imply endorsement,agreement or approval of any opinions, statements or information provided by SpaceDaily on any Web page published or hosted by SpaceDaily. Privacy Statement