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Lensless X-ray nanotechnique is developed
Argonne, Ill. (UPI) Feb 25, 2008 A U.S.-led team of scientists has developed a lensless X-ray technique that can record images of extremely tiny structures in nanoparticles and nanomaterials. Researchers at the U.S. Department of Energy's Argonne National Laboratory -- working with scientists from the University of California-Los Angeles, the University of Melbourne, La Trobe University in Melbourne and the Australian Synchrotron -- developed a way to examine internal and buried structures in micrometer-sized samples on the scale of nanometers. The scientists said the development might contribute to the understanding of disease and its eradication, healing after injury, cancer and cell death. X-ray resolution has traditionally been limited by lens technology, said Ian McNulty, the lead Argonne author of the study. "The new lensless technique avoids that limitation by using sophisticated algorithms to reconstruct the image," he said. He said the technique can be extended beyond the current resolution of about 20 nanometers to image the internal structure of micrometer-sized samples at finer resolution, reaching deep into the nanometer scale. The development of the new technique is reported in the journal Physical Review Letters. Community Email This Article Comment On This Article Related Links Nano Technology News From SpaceMart.com Computer Chip Architecture, Technology and Manufacture
Nanotechnology's Future Depends On Who The Public Trusts
Washington DC (SPX) Feb 19, 2008When the public considers competing arguments about a new technology's potential risks and benefits, people will tend to agree with the expert whose values are closest to their own, no matter what position the expert takes. The same will hold true for nanotechnology, a key study has found. |
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